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Prof. Xiang Zhang's Laboratory at UC Berkeley |
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Focused Ion Beam Technology Focused Ion Beam(FIB) is emerging as a powerful tool for 3D nanofabrication, which can perform milling, deposition, and imaging at nano-scale on a broad selection of materials by using a focused gallium ion beam with diameter of a few nanometers. This unique capability enables us to synthesize novel materials and construct new devices.
Fig 1. The Focused Ion Beam technology offers versatile nanofabrication means for novel materials and devices. Left: array of holes with grating. Right: nanorod.
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